Central Institute of Engineering, Electronics and Analytics (ZEA)
In cooperation with scientists from other institutes at Forschungszentrum Jülich, the Central Institute of Engineering, Electronics and Analytics (ZEA) develops devices, experiments, processes, analytical procedures and equipment, measuring and control equipment, and detector systems as well as computer-assisted tools and imaging techniques required for cutting-edge research that are not available on the market.
The institute advises and supports internal and external customers in all technology-related matters. It develops methods suitable to address new challenges and, if necessary, examines innovative solutions by means of feasibility studies. ZEA supports projects from the original idea up to the final product.
The Central Institute cooperates with universities and other scientific institutions all over the world and has been successfully providing training in technical and science-oriented vocations for many years.
The Central Institute of Engineering, Electronics and Analytics (ZEA) consists of three subinstitutes:
Engineering and Technology (ZEA-1)
Engineering and Technology designs, procures, and builds scientific and technical devices, facilities, and processes for Forschungszentrum Jülich and third parties. New technologies are developed in order to be able to react quickly and competently to the future requirements of science.
Electronic Systems (ZEA-2)
Electronic Systems develops complex system solutions in the fields of electronics and information technologies. In addition to cooperations with the scientists at Forschungszentrum Jülich, ZEA-2 also develops solutions on its own initiative for future use in science.
Analytics (ZEA-3)
Analytics works on solutions for complex analytical problems. Staff at ZEA-3 advise internal and external customers regarding all issues related to chemical analyses and develop suitable procedures and methods for new analytical challenges. ZEA-3 focuses on identifying and quantifying elements and molecules, and characterizing surfaces and layers.
